Preparation of sub-nanometer thickness-controlled tin dioxide films by pulsed atomic-layer CVD

Author: Takeuchi T.   Shoji K.   Tadano T.   Doteshita I.   Onodera S.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.442, Iss.1, 2003-10, pp. : 98-101

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract