Author： Thilakan P. Kumar J.
Publisher： Elsevier
ISSN： 0042-207X
Source： Vacuum, Vol.48, Iss.5, 1997-05, pp. : 463-466
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Preferred orientation and ferroelectric properties of lead zirconate titanate thin films
By Li X.-S. Tanaka T. Suzuki Y.
Thin Solid Films, Vol. 375, Iss. 1, 2000-10 ,pp. :
Access to resources
Recommend
Growth and preferred crystallographic orientation of hexaphenyl thin films
By Resel R. Koch N. Meghdadi F. Leising G. Unzog W. Reichmann K.
Thin Solid Films, Vol. 305, Iss. 1, 1997-08 ,pp. :
Structural studies of ITO thin films with the Rietveld method
Thin Solid Films, Vol. 332, Iss. 1, 1998-11 ,pp. :
PZT thin films with preferred-orientation induced by external stress
By Qin H.X. Zhu J.S. Jin Z.Q. Wang Y.
Thin Solid Films, Vol. 379, Iss. 1, 2000-12 ,pp. :