Nanoscale modification of conducting lines with a scanning force microscope

Author: Rank R.   Bruckl H.   Kretz J.   Monch I.   Reiss G.  

Publisher: Elsevier

ISSN: 0042-207X

Source: Vacuum, Vol.48, Iss.5, 1997-05, pp. : 467-472

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract