Critical layer thickness of InGaAs on GaAs examined by photoreflectance spectroscopy

Author: Sek G.   Misiewicz J.   Radziewicz D.   Tlaczala M.   Panek M.   Korbutowicz R.  

Publisher: Elsevier

ISSN: 0042-207X

Source: Vacuum, Vol.50, Iss.1, 1998-05, pp. : 219-221

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Abstract