Schottky barrier height dependence on the silicon interlayer thickness of Au\Si\n-GaAs contacts : chemistry of interface formation study

Author： Ivanco J.   Almeida J.   Coluzza C.   Zwick F.   Margaritondo G.  

Publisher： Elsevier

ISSN： 0042-207X

Source： Vacuum, Vol.50, Iss.3, 1998-07, pp. : 407-411

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