Author： Zuk J. Clouter M.J. Kulik M. Romanek J. Maczka D.
Publisher： Elsevier
ISSN： 0042-207X
Source： Vacuum, Vol.58, Iss.2, 2000-08, pp. : 543-550
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
RBS and ellipsometric studies of near surface GaAs ion implanted layers
By Kulik M. Herec J. Romanek J.
Vacuum, Vol. 63, Iss. 4, 2001-08 ,pp. :
Access to resources
Recommend
A study on the structural distribution of Se-passivated GaAs surface
By Kim J.-W. Sa S.-H. Kang M.-G. Park H.-H.
Thin Solid Films, Vol. 332, Iss. 1, 1998-11 ,pp. :
Diffusion and activation of Si implanted into GaAs
Vacuum, Vol. 70, Iss. 2, 2003-03 ,pp. :
Zn-induced features at the GaAs(110) surface: a first-principles study
Vacuum, Vol. 67, Iss. 1, 2002-09 ,pp. :