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Elsevier

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Variable-angle spectroscopic ellipsometry for deep UV characterization of dielectric coatings

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Patterning of multilayer dielectric optical coatings for multispectral CCDs

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Study of the formation of chromate conversion coatings on Alclad 2024 aluminum alloy using spectroscopic ellipsometry

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Interpretation of spectroscopic ellipsometry measurements of ultrathin dielectric layers on silicon: Impact of accuracy of the silicon optical constants

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