Combined in-depth scanning Auger microscopy and Raman scattering characterisation of CuInS 2 polycrystalline films

Author: Calvo-Barrio L.   Perez-Rodrguez A.   Alvarez-Garcia J.   Romano-Rodrguez A.   Barcones B.   Morante J.R.   Siemer K.   Luck I.   Klenk R.   Scheer R.  

Publisher: Elsevier

ISSN: 0042-207X

Source: Vacuum, Vol.63, Iss.1, 2001-07, pp. : 315-321

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Abstract