Auger electron spectroscopy (AES) and electron energy loss spectroscopy (EELS) studies of GaP and Si surfaces

Author： Paparazzo E.   Moretto L.   Brolatti M.  

Publisher： Elsevier

ISSN： 0042-207X

Source： Vacuum, Vol.65, Iss.2, 2002-04, pp. : 193-206

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