Author: Knizikevicius R. Galdikas A. Grigonis A.
Publisher: Elsevier
ISSN: 0042-207X
Source: Vacuum, Vol.66, Iss.1, 2002-06, pp. : 39-47
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Real dimensional simulation of SiO 2 etching in CF 4 +H 2 plasma
Vacuum, Vol. 65, Iss. 1, 2002-02 ,pp. :
Formation of polymeric layer during silicon etching in CF 2 Cl 2 plasma
By Grigonis A. Knizikevicius R. Rutkuniene Z. Tribandis D.
Vacuum, Vol. 70, Iss. 2, 2003-03 ,pp. :
The etching characteristics of YMnO 3 thin films in high density Ar/CF 4 plasma
Thin Solid Films, Vol. 434, Iss. 1, 2003-06 ,pp. :