Electrical characterization of sputtered Ge:Sb:Te films using impedance measurements

Author: Morales-Sanchez E.   Prokhorov E.F.   Mendoza-Galvan A.   Gonzalez-Hernandez J.  

Publisher: Elsevier

ISSN: 0042-207X

Source: Vacuum, Vol.69, Iss.1, 2002-12, pp. : 361-364

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Abstract