Author: Sharlandjiev P. Gushterova P.
Publisher: Elsevier
ISSN: 0042-207X
Source: Vacuum, Vol.69, Iss.1, 2002-12, pp. : 399-403
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Optical properties of very thin (<100 nm) sol-gel TiO 2 films
By Chrysicopoulou P. Davazoglou D. Trapalis C. Kordas G.
Thin Solid Films, Vol. 323, Iss. 1, 1998-06 ,pp. :
Microstructure and residual stress of very thin Mo films
By Adams D.P. Parfitt L.J. Bilello J.C. Yalisove S.M. Rek Z.U.
Thin Solid Films, Vol. 266, Iss. 1, 1995-09 ,pp. :