A perturbative diffraction theory of a multilayer system: applications to near-field optical microscopy SNOM and STOM

Author: Barchiesi D.   Van Labeke D.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.57, Iss.2, 1995-02, pp. : 196-203

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Abstract