Interpretable resolution of 0.2 nm at 100 kV using electron holography

Author: Harscher A.   Lang G.   Lichte H.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.58, Iss.1, 1995-04, pp. : 79-86

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract