Design of an objective lens pole piece for a transmission electron microscope with a resolution less than 0.1nm at 200kV

By Tsuno K.   Jefferson D.A.  

Ultramicroscopy, Vol. 72, Iss. 1, 1998-04 ,pp. : 31-39

Elsevier

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Comparison of electron diffraction data from non-linear optically active organic DMABC crystals obtained at 100 and 300kV

By Voigt-Martin I.G.   Kothe H.   Yakimansky A.V.   Tenkovtsev A.V.   Zandbergen H.   Jansen J.   Gilmore C.  

Ultramicroscopy, Vol. 83, Iss. 1, 2000-05 ,pp. : 33-59

Elsevier

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Design and performance of an ultra-high-resolution 300 kV microscope

By Bakker H.   Bleeker A.   Mul P.  

Ultramicroscopy, Vol. 64, Iss. 1, 1996-08 ,pp. : 17-34

Elsevier

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A spherical-aberration-corrected 200kV transmission electron microscope

By Haider M.   Rose H.   Uhlemann S.   Schwan E.   Kabius B.   Urban K.  

Ultramicroscopy, Vol. 75, Iss. 1, 1998-10 ,pp. : 53-60

Elsevier

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Thickness determination by measuring electron transmission in the TEM at 200kV

By Pozsgai I.  

Ultramicroscopy, Vol. 68, Iss. 1, 1997-05 ,pp. : 69-75

Elsevier

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