Author： Volkl E. Allard L.F. Datye A. Frost B.
Publisher： Elsevier
ISSN： 0304-3991
Source： Ultramicroscopy, Vol.58, Iss.1, 1995-04, pp. : 97-103
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Electron holography: optimum position of the biprism in the electron microscope
By Lichte H.
Ultramicroscopy, Vol. 64, Iss. 1, 1996-08 ,pp. :
Access to resources
Recommend
Far-out-of-focus electron holography in a dedicated FEG STEM
By Mankos M. Higgs A.A. Scheinfein M.R. Cowley J.M.
Ultramicroscopy, Vol. 58, Iss. 1, 1995-04 ,pp. :
Ferroelectric electron holography
By Lichte H. Reibold M. Brand K. Lehmann M.
Ultramicroscopy, Vol. 93, Iss. 3, 2002-12 ,pp. :
Artefacts in electron holography
By Lichte H. Geiger D. Harscher A. Heindl E. Lehmann M. Malamidis D. Orchowski A. Rau W.-D.
Ultramicroscopy, Vol. 64, Iss. 1, 1996-08 ,pp. :