Far-out-of-focus electron holography in a dedicated FEG STEM

Author： Mankos M.   Higgs A.A.   Scheinfein M.R.   Cowley J.M.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.58, Iss.1, 1995-04, pp. : 87-96

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