Structure determination at the atomic level from dynamical electron diffraction data under systematic row conditions

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Ultramicroscopy, Vol. 88, Iss. 3, 2001-08 ,pp. : 195-209

Elsevier

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Conditions and reasons for incoherent imaging in STEM

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The orthogonalized plane-wave method applied to the calculation of dynamical effects in electron diffraction

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Comparison of calculated and observed dynamical diffraction from purple membrane: implications

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