Determination of Cr particle sizes in thin dilute Cr-in-Cu films from measurement statistics

Author： Klotzkin D.   Isaacson M.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.58, Iss.3, 1995-06, pp. : 261-267

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Semiconductor properties of passive films formed on sputter-deposited Fe–18Cr alloy thin films with various additive elements

By  

Science and Technology of Advanced Materials, Vol. 5, Iss. 1-2, 2004-01 ,pp. : 182-187

IOP Publishing

Access to resources Recommend Favorite

Study of rapidly solidified Cu–Cr–RE alloys

By  

Science and Technology of Advanced Materials, Vol. 2, Iss. 1, 2001-03 ,pp. : 83-86

IOP Publishing

Access to resources Recommend Favorite

Ultrafast measurement in GaAs thin films using NSOM

By Smith S.   Holme N.C.R.   Orr B.   Kopelman R.   Norris T.  

Ultramicroscopy, Vol. 71, Iss. 1, 1998-03 ,pp. : 213-223

Elsevier

Access to resources Recommend Favorite

A quantitative determination of the development of texture in thin films

By Lindsay R.   Chapman J.N.   Craven A.J.   McBain D.  

Ultramicroscopy, Vol. 80, Iss. 1, 1999-08 ,pp. : 41-50

Elsevier

Access to resources Recommend Favorite

Interface morphology evolvement and microstructure characteristics of hypoeutectic Cu–1.0 wt%Cr alloy during unidirectional solidification

By  

Science and Technology of Advanced Materials, Vol. 6, Iss. 8, 2005-11 ,pp. : 74-79

IOP Publishing

Access to resources Recommend Favorite