Author: Gubbens A.J. Kraus B. Krivanek O.L. Mooney P.E.
Publisher: Elsevier
ISSN: 0304-3991
Source: Ultramicroscopy, Vol.59, Iss.1, 1995-07, pp. : 255-265
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Voltage-center and coma-free alignment for high-resolution electron microscopy
Ultramicroscopy, Vol. 62, Iss. 1, 1996-01 ,pp. :
By Henning P. Wallenberg L.R. Jarrendahl K. Hultman L. Falk L.K.L. Sundgren J.-E.
Ultramicroscopy, Vol. 66, Iss. 3, 1996-12 ,pp. :