Mapping of lateral vibration of the tip in atomic force microscopy at the torsional resonance of the cantilever

By Kawagishi T.   Kato A.   Hoshi Y.   Kawakatsu H.  

Ultramicroscopy, Vol. 91, Iss. 1, 2002-05 ,pp. : 37-48

Elsevier

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Developments for inverted atomic force microscopy

By Mabry J.C.   Yau T.   Yap H.   Green J.-B.D.  

Ultramicroscopy, Vol. 91, Iss. 1, 2002-05 ,pp. : 73-82

Elsevier

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Atomic force microscopy in analytical biotechnology

By Allen S.   Davies M.C.   Roberts C.J.   Tendler S.J.B.   Williams P.M.  

Trends in Biotechnology, Vol. 15, Iss. 3, 1997-03 ,pp. : 101-105

Elsevier

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Spatially resolved force spectroscopy of biological surfaces using the atomic force microscope

By Heinz W.F.   Hoh J.H.  

Trends in Biotechnology, Vol. 17, Iss. 4, 1999-04 ,pp. : 143-150

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A complementary-metal-oxide-semiconductor-field-effect-transistor-compatible atomic force microscopy tip fabrication process and integrated atomic force microscopy cantilevers fabricated with this process

By Ono M.   Lange D.   Brand O.   Hagleitner C.   Baltes H.  

Ultramicroscopy, Vol. 91, Iss. 1, 2002-05 ,pp. : 9-20

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