Preparation of TEM plan-view and cross-sectional specimens of ZnSeGaAs epilayers by chemical thinning and argon ion milling

Author: N. W.   K. K.F.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.60, Iss.3, 1995-10, pp. : 427-435

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Abstract