Author： Paciornik S. Kilaas R. Turner J. Dahmen U.
Publisher： Elsevier
ISSN： 0304-3991
Source： Ultramicroscopy, Vol.62, Iss.1, 1996-01, pp. : 15-27
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Automated image processing for grain boundary analysis
Ultramicroscopy, Vol. 96, Iss. 2, 2003-08 ,pp. :
Access to resources
Recommend
A comparison between three-dimensional and two-dimensional grain boundary plane analysis
Ultramicroscopy, Vol. 90, Iss. 2, 2002-02 ,pp. :
Analysis of the capability of HREM applied to quantum heterostructures
Ultramicroscopy, Vol. 63, Iss. 2, 1996-06 ,pp. :
Analysis of irradiated Ag and Si by molecular dynamics and simulated HREM images
Ultramicroscopy, Vol. 58, Iss. 3, 1995-06 ,pp. :