On the many advantages of local-electrode atom probes

Author: Kelly T.F.   Camus P.P.   Larson D.J.   Holzman L.M.   Bajikar S.S.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.62, Iss.1, 1996-01, pp. : 29-42

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Abstract