Author: Owen C.H. Landis W.J.
Publisher: Elsevier
ISSN: 0304-3991
Source: Ultramicroscopy, Vol.63, Iss.1, 1996-04, pp. : 27-38
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
A marker-free alignment method for electron tomography
By Yu L. Penczek P.A. McEwen B.F. Frank J.
Ultramicroscopy, Vol. 58, Iss. 3, 1995-06 ,pp. :
Lens-field center alignment for high resolution electron microscopy
Ultramicroscopy, Vol. 65, Iss. 1, 1996-09 ,pp. :
Voltage-center and coma-free alignment for high-resolution electron microscopy
Ultramicroscopy, Vol. 62, Iss. 1, 1996-01 ,pp. :