Author： Matsumoto T. Tonomura A.
Publisher： Elsevier
ISSN： 0304-3991
Source： Ultramicroscopy, Vol.63, Iss.1, 1996-04, pp. : 5-10
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Transmission electron microscopy with Zernike phase plate
Ultramicroscopy, Vol. 88, Iss. 4, 2001-09 ,pp. :
Access to resources
Recommend
Quantitative phase-sensitive imaging in a transmission electron microscope
By Bajt S. Barty A. Nugent K.A. McCartney M. Wall M. Paganin D.
Ultramicroscopy, Vol. 83, Iss. 1, 2000-05 ,pp. :
A new phase consistency criterion and its application in electron crystallography
By He W. Carazo J.-M. Fernandez J.-J.
Ultramicroscopy, Vol. 85, Iss. 2, 2000-10 ,pp. :
Experimental study of amplitude and phase detection limits in electron holography
Ultramicroscopy, Vol. 64, Iss. 1, 1996-08 ,pp. :
A Fourier approach to fields and electron optical phase-shifts calculations
By Beleggia M. Fazzini P.F. Pozzi G.
Ultramicroscopy, Vol. 96, Iss. 1, 2003-07 ,pp. :