Author: Op de Beeck M. Van Dyck D. Coene W.
Publisher: Elsevier
ISSN: 0304-3991
Source: Ultramicroscopy, Vol.64, Iss.1, 1996-08, pp. : 167-183
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Abstract
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Ultramicroscopy, Vol. 64, Iss. 1, 1996-08 ,pp. :