Design of an objective lens pole piece for a transmission electron microscope with a resolution less than 0.1nm at 200kV

By Tsuno K.   Jefferson D.A.  

Ultramicroscopy, Vol. 72, Iss. 1, 1998-04 ,pp. : 31-39

Elsevier

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Correction of three-fold astigmatism for ultra-high-resolution TEM

By Overwijk M.H.F.   Bleeker A.J.   Thust A.  

Ultramicroscopy, Vol. 67, Iss. 1, 1997-06 ,pp. : 163-170

Elsevier

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Sub-Ångstrom high-resolution transmission electron microscopy at 300keV

By O'Keefe M.A.   Hetherington C.J.D.   Wang Y.C.   Nelson E.C.   Turner J.H.   Kisielowski C.   Malm J.-O.   Mueller R.   Ringnalda J.   Pan M.   Thust A.  

Ultramicroscopy, Vol. 89, Iss. 4, 2001-11 ,pp. : 215-241

Elsevier

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A spherical-aberration-corrected 200kV transmission electron microscope

By Haider M.   Rose H.   Uhlemann S.   Schwan E.   Kabius B.   Urban K.  

Ultramicroscopy, Vol. 75, Iss. 1, 1998-10 ,pp. : 53-60

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Experimental characterisation of CCD cameras for HREM at 300kV

By Meyer R.R.   Kirkland A.I.   Dunin-Borkowski R.E.   Hutchison J.L.  

Ultramicroscopy, Vol. 85, Iss. 1, 2000-09 ,pp. : 9-13

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