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By Hofer F.   Warbichler P.   Grogger W.  

Ultramicroscopy, Vol. 59, Iss. 1, 1995-07 ,pp. : 15-31

Elsevier

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Assessment of the quantitative characterization of localized strain using electron diffraction contrast imaging

By Janssens K.G.F.   Van der Biest O.   Vanhellemont J.   Maes H.E.  

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Concentration limits for the measurement of boron by electron energy-loss spectroscopy and electron-spectroscopic imaging

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Ultramicroscopy, Vol. 87, Iss. 3, 2001-04 ,pp. : 135-145

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The orthogonalized plane-wave method applied to the calculation of dynamical effects in electron diffraction

By Barreteau C.   Ducastelle F.  

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Computational comparisons between the conventional multislice method and the third-order multislice method for calculating high-energy electron diffraction and imaging

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