Relativistic ionisation cross sections for use in microanalysis

By Knippelmeyer R.   Wahlbring P.   Kohl H.  

Ultramicroscopy, Vol. 68, Iss. 1, 1997-05 ,pp. : 25-41

Elsevier

Access to resources Recommend Favorite

A comparison of EDS microanalysis in FIB-prepared and electropolished TEM thin foils

By Hutchinson C.R.   Hackenberg R.E.   Shiflet G.J.  

Ultramicroscopy, Vol. 94, Iss. 1, 2003-01 ,pp. : 37-48

Elsevier

Access to resources Recommend Favorite

Preliminary investigation of two methods for the automatic handling of multivariate maps in microanalysis

By Bonnet N.  

Ultramicroscopy, Vol. 57, Iss. 1, 1995-01 ,pp. : 17-27

Elsevier

Access to resources Recommend Favorite

Preliminary investigation of two methods for the automatic handling of multivariate maps in microanalysis

By Bonnet N.  

Ultramicroscopy, Vol. 58, Iss. 3, 1995-06 ,pp. : 441-442

Elsevier

Access to resources Recommend Favorite

A comparison between quantitative EELS and APFIM microanalysis of carbonitride grains in cermets

By Zackrisson J.   Grogger W.   Hofer F.   Andren H.-O.  

Ultramicroscopy, Vol. 79, Iss. 1, 1999-09 ,pp. : 273-281

Elsevier

Access to resources Recommend Favorite