A comparison of EDS microanalysis in FIB-prepared and electropolished TEM thin foils

Author： Hutchinson C.R.   Hackenberg R.E.   Shiflet G.J.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.94, Iss.1, 2003-01, pp. : 37-48

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