A study of semiconductor surfaces and devices by coupled IR photon tunneling and atomic-force microscopy

Author： Gall-Borrut P. Castagne M. Weyher J.L. Fillard J.P. Bonnafe J.

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.71, Iss.1, 1998-03, pp. : 231-234

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