Cantilever probes for SNOM applications with single and double aperture tips

Author: Oesterschulze E.   Rudow O.   Mihalcea C.   Scholz W.   Werner S.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.71, Iss.1, 1998-03, pp. : 85-92

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Abstract