Transmission resonance diffraction and low impact parameter inelastic scattering of high-energy electrons - Theory and Application

Author: Rossouw C.J.   Dudarev S.L.   Josefsson T.W.   Allen L.J.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.72, Iss.1, 1998-04, pp. : 17-29

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Abstract