Author： Zhang X. Weierstall U. Spence J.C.H.
Publisher： Elsevier
ISSN： 0304-3991
Source： Ultramicroscopy, Vol.72, Iss.1, 1998-04, pp. : 67-81
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
An imaging filter for high voltage electron microscopy
By Gubbens A.J. Kraus B. Krivanek O.L. Mooney P.E.
Ultramicroscopy, Vol. 59, Iss. 1, 1995-07 ,pp. :
Access to resources
Recommend
Analysis of carbon film planarity by reflection light microscopy
Ultramicroscopy, Vol. 63, Iss. 3, 1996-07 ,pp. :
Apertureless near-field scanning Raman microscopy using reflection scattering geometry
Ultramicroscopy, Vol. 94, Iss. 3, 2003-04 ,pp. :
Visualization of latent images by reflection near field optical microscopy
By Bergossi O. Spajer M. Schiavone P.
Ultramicroscopy, Vol. 61, Iss. 1, 1995-12 ,pp. :