An approximate multi-beam form of the ''ellipse'' in high-resolution transmission electron microscopy

Author: Hu J.J.   Tanaka N.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.74, Iss.3, 1998-08, pp. : 105-111

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content