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By Kisielowski C.   Schwander P.   Baumann F.H.   Seibt M.   Kim Y.   Ourmazd A.  

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Elsevier

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Sub-Ångstrom high-resolution transmission electron microscopy at 300keV

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Optimum condition of convergent beam illumination for observation of local structure by high resolution transmission electron microscopy

By Mitome M.   Takayanagi K.  

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Phase retrieval and aberration correction in the presence of vortices in high-resolution transmission electron microscopy

By Allen L.J.   Faulkner H.M.L.   Oxley M.P.   Paganin D.  

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Impact of column bending in high-resolution transmission electron microscopy on the strain evaluation of GaAs/InAs/GaAs heterostructures

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