Cantilever probes for SNOM applications with single and double aperture tips

By Oesterschulze E.   Rudow O.   Mihalcea C.   Scholz W.   Werner S.  

Ultramicroscopy, Vol. 71, Iss. 1, 1998-03 ,pp. : 85-92

Elsevier

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Contrast mechanisms in illumination-mode SNOM

By Valle P.J.   Carminati R.   Greffet J.-J.  

Ultramicroscopy, Vol. 71, Iss. 1, 1998-03 ,pp. : 39-48

Elsevier

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Optimizing the fabrication of aluminum-coated fiber probes and their application to optical near-field lithography

By Madsen S.   Holme N.C.R.   Ramanujam P.S.   Hvilsted S.   Hvam J.M.   Smith S.J.  

Ultramicroscopy, Vol. 71, Iss. 1, 1998-03 ,pp. : 65-71

Elsevier

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On the spatial resolution of uncoated optical-fiber probes in internal reflection near-field scanning optical microscopy

By Atia W.A.   Pilevear S.   Gungor A.   Davis C.C.  

Ultramicroscopy, Vol. 71, Iss. 1, 1998-03 ,pp. : 379-382

Elsevier

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Analysis of fiber probes of scanning near-field optical microscope by field emission microscopy

By Sekatskii S.K.   Mironov B.N.   Lapshin D.A.   Dietler G.   Letokhov V.S.  

Ultramicroscopy, Vol. 89, Iss. 1, 2001-10 ,pp. : 83-87

Elsevier

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