An ''on-line'' correction method of defocus and astigmatism in HAADF-STEM

Author: Tanaka N.   Hu J.J.   Baba N.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.78, Iss.1, 1999-06, pp. : 103-110

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Abstract