Detection of subsurface voids using scanning thermal microscopy

Author: Mills G.   Weaver J.M.R.   Harris G.   Chen W.   Carrejo J.   Johnson L.   Rogers B.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.80, Iss.1, 1999-08, pp. : 7-11

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Abstract