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Ultramicroscopy, Vol. 66, Iss. 3, 1996-12 ,pp. : 193-209

Elsevier

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A high-resolution serial sectioning specimen preparation technique for application to electron backscatter diffraction

By Wall M.A.   Schwartz A.J.   Nguyen L.  

Ultramicroscopy, Vol. 88, Iss. 2, 2001-07 ,pp. : 73-83

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Grain boundary studies of high-temperature superconducting materials using electron backscatter Kikuchi diffraction

By Goyal A.   Specht E.D.   Wang Z.L.   Kroeger D.M.  

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Measurement of elastic strains and small lattice rotations using electron back scatter diffraction

By Wilkinson A.J.  

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Analysis of grain boundary dislocations by large angle convergent beam electron diffraction

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