Automated identification of symmetry in CBED patterns: a genetic approach

Author: Hu G.B.   Peng L.-M.   Yu Q.F.   Lu H.Q.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.84, Iss.1, 2000-07, pp. : 47-56

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Abstract