A new phase consistency criterion and its application in electron crystallography

Author: He W.   Carazo J.-M.   Fernandez J.-J.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.85, Iss.2, 2000-10, pp. : 73-91

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract