Selective specimen preparation for TEM observation of the cross-section of individual carbon nanotube/metal junctions

Author： Wei B.   Kohler-Redlich P.   Bader U.   Heiland B.   Spolenak R.   Arzt E.   Ruhle M.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.85, Iss.2, 2000-10, pp. : 93-98

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