High-angle annular dark-field STEM observation of Xe nanocrystals embedded in Al

Author： Mitsuishi K. Kawasaki M. Takeguchi M. Yasuda H. Furuya K.

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.88, Iss.1, 2001-06, pp. : 25-31

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