Author: Kisielowski C. Hetherington C.J.D. Wang Y.C. Kilaas R. O'Keefe M.A. Thust A.
Publisher: Elsevier
ISSN: 0304-3991
Source: Ultramicroscopy, Vol.89, Iss.4, 2001-11, pp. : 243-263
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Abstract
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