A sub-50meV spectrometer and energy filter for use in combination with 200kV monochromated (S)TEMs

Author: Brink H.A.   Barfels M.M.G.   Burgner R.P.   Edwards B.N.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.96, Iss.3, 2003-09, pp. : 367-384

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Abstract