Author: Brink H.A. Barfels M.M.G. Burgner R.P. Edwards B.N.
Publisher: Elsevier
ISSN: 0304-3991
Source: Ultramicroscopy, Vol.96, Iss.3, 2003-09, pp. : 367-384
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
A spherical-aberration-corrected 200kV transmission electron microscope
By Haider M. Rose H. Uhlemann S. Schwan E. Kabius B. Urban K.
Ultramicroscopy, Vol. 75, Iss. 1, 1998-10 ,pp. :
Thickness determination by measuring electron transmission in the TEM at 200kV
By Pozsgai I.
Ultramicroscopy, Vol. 68, Iss. 1, 1997-05 ,pp. :
A model for the hillock formation on graphite surfaces by 246MeV Kr + ions
By Nagy P. Szabo B. Szabo Z. Havancsak K. Biro L.P. Gyulai J.
Ultramicroscopy, Vol. 86, Iss. 1, 2001-01 ,pp. :