Method of estimating the parameters of distributions of random sequences in statistical investigations of the quality of optoelectronic devices

Author： Alekhnovich V.   Martynov A.   Perchik A.   Utkin G.  

Publisher： Springer Publishing Company

ISSN： 0543-1972

Source： Measurement Techniques, Vol.49, Iss.11, 2006-11, pp. : 1114-1120

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