The Use of Correlation Analysis of the Image in Phase Optoelectronic Devices

By Soldatov V.  

Measurement Techniques, Vol. 48, Iss. 5, 2005-05 ,pp. : 471-475

Springer Publishing Company

Access to resources Recommend Favorite

Development of a System of Metrological Supervision of Thermovision Measuring Devices

By Sil'd Yu. A.   Ivanova M. A.   Nikonenko V. A.  

Measurement Techniques, Vol. 47, Iss. 4, 2004-04 ,pp. : 389-392

Springer Publishing Company

Access to resources Recommend Favorite

Method and Devices for Measuring Magnetic Field Parameters

By Suchkov G.  

Measurement Techniques, Vol. 48, Iss. 3, 2005-03 ,pp. : 255-259

Springer Publishing Company

Access to resources Recommend Favorite

Method of estimating the parameters of distributions of random sequences in statistical investigations of the quality of optoelectronic devices

By Alekhnovich V.   Martynov A.   Perchik A.   Utkin G.  

Measurement Techniques, Vol. 49, Iss. 11, 2006-11 ,pp. : 1114-1120

Springer Publishing Company

Access to resources Recommend Favorite

Electrical Methods of Monitoring and Strengthening Electron Devices

By Bogomol'nyi V. M.  

Measurement Techniques, Vol. 46, Iss. 11, 2003-11 ,pp. : 1079-1083

Springer Publishing Company

Access to resources Recommend Favorite