Proposal of Fault Diagnosis of Analog Circuits by Combining Operation-Region Model and X – Y Zoning Method: Case Study

By Miura Yukiya  

Journal of Electronic Testing, Vol. 22, Iss. 4-6, 2006-12 ,pp. : 411-423

Springer Publishing Company

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Fault Detection in Switched Current Circuits Using Built-in Transient Current Sensors

By Lechuga Y.  

Journal of Electronic Testing, Vol. 21, Iss. 6, 2005-12 ,pp. : 583-598

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Structural Fault Modeling and Fault Detection Through Neyman–Pearson Decision Criteria for Analog Integrated Circuits

By Zjajo Amir   Pineda de Gyvez Jose   Gronthoud Guido  

Journal of Electronic Testing, Vol. 22, Iss. 4-6, 2006-12 ,pp. : 399-409

Springer Publishing Company

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Thermal Testing of Analogue Integrated Circuits: A Case Study

By Altet J.  

Journal of Electronic Testing, Vol. 19, Iss. 3, 2003-06 ,pp. : 353-357

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Improving Design and Fault Detection in Linear and Nonlinear High Frequency Circuits by Performing a Sensitivity Based Analysis

By Sylla I.T.  

Analog Integrated Circuits and Signal Processing, Vol. 27, Iss. 3, 2001-05 ,pp. : 247-258

Springer Publishing Company

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