Author： Chen W-Y.
Publisher： Springer Publishing Company
ISSN： 0923-8174
Source： Journal of Electronic Testing, Vol.18, Iss.1, 2002-02, pp. : 17-28
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Selection of Crosstalk-Induced Faults in Enhanced Delay Test
By Li Huawei
Journal of Electronic Testing, Vol. 21, Iss. 2, 2005-04 ,pp. :
Access to resources
Recommend
Automatic Test Pattern Generation for Resistive Bridging Faults
By Engelke Piet
Journal of Electronic Testing, Vol. 22, Iss. 1, 2006-02 ,pp. :
Crosstalk Induced Fault Analysis and Test in DRAMs
Journal of Electronic Testing, Vol. 22, Iss. 2, 2006-04 ,pp. :
Generation of Electrically Induced Stimuli for MEMS Self-Test
By Charlot B.
Journal of Electronic Testing, Vol. 17, Iss. 6, 2001-12 ,pp. :