Design for Consecutive Testability of System-on-a-Chip with Built-In Self Testable Cores

Author: Yoneda T.  

Publisher: Springer Publishing Company

ISSN: 0923-8174

Source: Journal of Electronic Testing, Vol.18, Iss.4-5, 2002-08, pp. : 487-501

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract